This seminar describes each technique in depth, how to apply it, and how to interpret results. A list of recommended equipment is presented. The techniques presented sometimes use test equipment in unusual ways. The course includes a combination of teaching methods including lecture, live experiments, live computer simulations and still pictures of experiments with results.  All circuit designers, system designers, design supervisors, even EMC personnel will find the material useful.

Learn the simple theory behind easy to use development lab tests that can find EMC problems, measure the resonant frequency of physical structures like heat sinks or edge connectors and learn the design errors than can cause EMC problems and how to find them in a design.  In addition Doug will discuss how to measure EMI currents in systems and recognize when they are a problem, relate the easily measurable relative phase of EMI currents to fixing EMC problems and provide construction techniques for useful laboratory apparatus that can track down problems.

The technical background that will be discussed include Loop theory and resonant frequency of physical structures, Common mode current relationship to EMC emissions, Using current probes to find EMC problems, Design of system cables and connectors and their relationship to EMC, Differential signals and Skin effect.

In addition to various techniques and methods to predict EMC problems, there will also be hands-on experiments by class attendees to discuss resonant frequency of a circuit board mounted over sheet metal and shielding effectiveness.

For more details on the seminar, please click here.

Who is it for?

All circuit designers, system designers, design supervisors, even EMC personnel will find the material useful. A college-level course on circuit analysis is desirable although the seminar will be useful to those with two year technical degrees.

When:   Friday, December 5, 2008
Time:     8.30am-12.30pm
Where: Elliott Laboratories, Sunnyvale CA facility (Driving Directions)
Cost:     $295

About the Speaker:

Doug Smith currently is an independent consultant specializing in high frequency measurements, circuit/system design and verification, switching power supply noise and specifications, EMC, and immunity to transient noise. He is a Senior Member of the IEEE and a former member of the IEEE EMC Society Board of Directors.

His technical interests include high frequency effects in electronic circuits, including topics such as Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), and other forms of pulsed electromagnetic interference. He also has been involved with FCC Part 68 testing and design, telephone system analog and digital design, IC design, and computer simulation of circuits. He has been granted over 15 patents, several on measurement apparatus.  Doug has lectured at Oxford University, Vanderbilt University, AT&T Bell Labs, and at many public and private seminars on high frequency measurements, circuit design, ESD, and EMC. He is author of the book High Frequency Measurements and Noise in Electronic Circuits.