In this Issue

Seminar on EMC Lab Techniques

Upcoming Events and Developments

Updates from TCB Council Training  2011

NEBS Seminar

Date to be announced

NTS Silicon Valley will be hosting a NEBS Seminar in the upcoming year at our Newark, CA location.

Please take a moment to send us a brief message and let us know of the topics and issues you would like to see covered during this one day event.

We look forward to your interest and participation!

Upcoming Events

2011 NI Technical Symposiums

Multiple Dates 

and Locations

EMC Lab Techniques

December 12, 2011

Newark, CA

Nuclear Power International/ PowerGen

December 13-15, 2011

Las Vegas, NV

Booth 2230

NTS Silicon Valley announces Upcoming Testing Capabilities

As part of the ongoing expansion of our testing and certification capabilities, NTS Silicon Valley is excited to announce these upcoming services in the Newark, CA facility:

- Watt-hour meter testing

- HALT/HASS testing

- Metallic Interface testing

- GR-63 CORE Services

•     Fire
•     Mixed Flow Gas
•     Hygroscopic Dust

The custom-built Climatic, Environmental and Dynamics Product Testing Laboratory in Newark, CA currently offers a wide range of services such as shock and vibration testing, thermal stress and extreme environment simulation. These additions make NTS Silicon Valley a viable local solution for many Bay Area manufacturers who have had to take their testing requirements to laboratories outside of the region to meet their full range of needs.

Please contact us for more information at info@elliottlabs.com or call at 510-578-3500 on how we can assist with your next project.

Updates from TCB Training: A Sampling of Critical Updates

By David Bare, Chief Engineer- NTS Silicon Valley

The recent TCB Council training in Baltimore covered many critical changes to the processes and interpretations.

1. U-NII Device Test Procedure – A new procedure for testing U-NII devices was published by the FCC (KDB 789033) that provides for alternative methods of performing power, Power Spectral Density, Peak excursion and spurious emissions testing for U-NII products. It also clarified the FCC position for the detector used to meet the -27dBm/MHz limit as Peak.

2. A draft of new test procedures for digital transmission system devices has been published by the FCC (KDB 718828) to replace KDB 558074. It features new methods for measuring power, PSD and spurious emissions. The FCC is reviewing comments received on the draft and will soon publish the new KDB.  

3. Modular approvals – The FCC is reviewing their requirements for modular transmitter certifications. Likely changes are more documentation requirements to integrators, allowing integrators to change grant conditions and less restrictions on host trace connections to antenna.

4. Industry Canada Masks – IC has made available some of the Radio Standard Specification emission masks in a graphical presentation using Agilent VEE Runtime 9.2. For more information, click here.

For more information about how this change affects your products or for a price quote for services, please contact us at info@elliottlabs.com or call at 510-578-3500.