Designers, test and quality engineers should mark their calendars for December 12, 2011, when renowned EMC guru, Doug Smith will be presenting a half day lecture on Practical Methods to Find EMC Problems in the Development Lab

This seminar covers techniques for finding design issues that may cause EMC compliance problems early in the design cycle, long before an official EMC test. This can be accomplished in the development lab without a lot of fancy EMC equipment. These techniques are easy to use and can find a wide range of potential EMC problems in a design right on the lab workbench.

Learn the simple theory behind easy to use development lab tests that can find EMC problems, find and evaluate potential EMC problems with readily available lab equipment, the design errors than can cause EMC problems and how to find them in a design. Learn to measure EMI currents in systems and recognize when they are a problem and to relate the easily measurable relative phase of EMI currents to fixing EMC problems.

Plus several new video and experiments to demonstrate how an integrated circuit can use nearby cables to cause an emissions failure when the IC alone could not be a problem and the relationship of vias to board resonances on a 4 layer PCB!

As a special bonus, Doug will include an option of purchasing a one year subscription to his engineering training site http://CircuitAdvisor.com at 50% off as part of this seminar (Regular subscription price $100/yr). This website is a new interactive approach to learning about circuit theory and techniques that you can use on everyday projects on the job. It includes audio and video files and innovative ideas, products or topics leading the engineering world.

For more details on the seminar, please click here.

Who is it for?

All circuit designers, system designers, design supervisors, even EMC personnel will find the material useful.


When: Monday, December 12, 2011

Time: 8.30am-12.30pm

Where: NTS Silicon Valley/Elliott Laboratories, Newark, CA (Driving Directions)

Cost: $350; $400 with 1 year CircuitAdvisor Subscription

A 10% discount for two or more registrations from the same organization


If you and your colleagues would like to attend the seminar please click on the link below to register. Space is limited so please register asap to confirm your attendance at this event. We look forward to seeing you here on December 12.


 

About the Speaker:

Doug Smith currently is an independent consultant specializing in high frequency measurements, circuit/system design and verification, switching power supply noise and specifications, EMC, and immunity to transient noise. He is a Senior Member of the IEEE and a former member of the IEEE EMC Society Board of Directors.

His technical interests include high frequency effects in electronic circuits, including topics such as Electromagnetic Compatibility (EMC), Electrostatic Discharge (ESD), Electrical Fast Transients (EFT), and other forms of pulsed electromagnetic interference. He also has been involved with FCC Part 68 testing and design, telephone system analog and digital design, IC design, and computer simulation of circuits. He has been granted over 15 patents, several on measurement apparatus. Doug has lectured at Oxford University, Vanderbilt University, AT&T Bell Labs, and at many public and private seminars on high frequency measurements, circuit design, ESD, and EMC. He is author of the book High Frequency Measurements and Noise in Electronic Circuits.